The MRR method is very reliable for high frequency characterization of dielectric materials. Microstrip-ring resonators with via-less conductor-backed co-planar waveguide (CBCPW) probe pads, transitions and feed lines are shown in Figure 1. The insertion loss of microstrip-ring resonators (MRR) has resonant periodic peaks. Hence, the electrical parameters (dielectric constant and loss tangent) can be extracted at multiple frequencies from the response of MRR.  Dielectric constant is extracted from the location of resonant peaks while loss tangent of the material is calculated by unloaded quality factor of the peaks.

Figure 1:  Microstrip ring resonator: (a) material stack-up and (b) MRR with feed lines and CBCPW to microstrip transition.

As part of the 5G/6G MAESTRO project, work on this page is supported by the Office of Advanced Manufacturing in the National Institute of Standards and Technology (NIST), under the Federal Award ID Number 70NANB22H050.

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