Reliable, repeatable, fast low loss material characterization (Dk, loss tangent)
Currently there are multiple different test methods, most of them resonator based and they suffer from lack of standard measurement protocols. Many of the current supply chain uses extrapolation based on measurements at lower frequencies (such as 10 GHz) and there could be major inaccuracies in the extrapolation methods.
For a comprehensive report visit https://www.inemi.org/article_content.asp?adminkey=5cc4f4100ebf2ba1f3e6fd6294749139&article=161
As part of the 5G/6G MAESTRO project, work on this page is supported by the Office of Advanced Manufacturing in the National Institute of Standards and Technology (NIST), under the Federal Award ID Number 70NANB22H050.