Materials Characterization

• Accurately characterize anisotropic behavior
• Minimal variation between measured and operational characteristics
• Higher frequencies for 5G result in requirements for lower dimensional variation and measurement errors

• Lack of Standard Reference Material (SRM)
• Reliable, repeatable, fast low loss material characterization (Dk, loss tangent)

• Time-domain materials characterization techniques
• Split-post dielectric resonator (SPDR)
• Split-cylinder resonator (SCR)
• On-chip resonators and microstrip-ring resonators (MRR)
• Microstrip line charaterization
• Free-space materials characterization techniques
• Fabry-Perot open resonator (FPOR)
• Co-planar waveguide (CPW)
• Bereskin stripline transmission line method
• Balanced-type circular disk resonator (BCDR)