Component-level
Technical Needs, Gaps and Solutions
Component-level rework and repair technology issues, the associated needs, technology status of those needs, as well as gaps and challenges to overcome, are summarized below. The time period considered is from 2024 to 2034.
Technology Status Legend
For each need, the status of today’s technology is indicated by label and color as follows:
In-table color + label key | Description of Technology Status |
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Solutions not known | Solutions not known at this time |
Solutions need optimization | Current solutions need optimization |
Solutions deployed or known | Solutions deployed or known today |
Not determined | TBD |
Table 1. Component-level Rework and Repair Gaps, and Today’s Technology Status with Respect to Current and Future Needs
At the component/socket level, on-going miniaturization and increasing integration of heterogenous elements are key drivers for many of the needs and challenges.
| ROADMAP TIMEFRAME | |||
TECHNOLOGY ISSUE | TODAY (2024) | 3 YEARS (2027) | 5 YEARS (2029) | 10 YEARS (2034) |
COMPONENT-LEVEL ISSUE #1: 01005 (0402 metric) and smaller size chip rework | ||||
NEED | 01005 (0402 Metric) rework. Equipment capital or highly skilled personnel to complete this type of rework | Smaller sizes than 01005 (0402 metric) components needed to be reworked, e.g., 0201 metric. Increased equipment capital or highly skilled personnel to complete this type of rework | ||
CURRENT TECHNOLOGY STATUS | Solutions deployed or known | Solutions need optimization | ||
Equipment technology available. No demand/cost feasibility for equipment. | Developments needed. No demand/ cost feasibility for equipment. | |||
GAPS |
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CHALLENGE | Increasing 1st pass yield and reducing cycle time for 01005 rework | How practical is it to rework 0201 metric components in high density applications. | ||
COMPONENT-LEVEL ISSUE #2: PoP (Package on Package) rework (multiple substrates) (up to 4 PoP stack up) | ||||
NEED | Process challenge. Need high process precision control. Thinner layers for POP component substrates- increased warpage. (CTE issues) | |||
CURRENT TECHNOLOGY STATUS | Solutions deployed or known | |||
Equipment to rework PoP components is available. PoP stack ups will not likely increase from up to 4 in the near to long term as component development technologies are going into other areas,. | ||||
GAPS |
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CHALLENGE |
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COMPONENT-LEVEL ISSUE #3: Large BGA rework and Socket rework requirements | ||||
NEED | Equipment update requirements: optical and component handling/placement issues. Standard for components delta T is typically <10C. For large packages keeping a low delta T is a challenge. | |||
BGA rework and sockets requirements (90 mm/100 mm and above). | Package size will continue to increase from 100 mm sockets to potentially up to 125 mm-130 mm for BGA sockets. | 130 mm BGA sockets. | 150 mm BGA sockets. | |
CURRENT TECHNOLOGY STATUS | Solutions need optimization | Solutions not known | ||
Some availability of equipment. | New developments in equipment needed. | |||
GAPS |
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CHALLENGES |
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COMPONENT-LEVEL ISSUE #4: Micro-package rework QFN/BTC/DFN | ||||
NEED | Component handling and vision alignment. (Adjacent component issues) | |||
(Chip-scale packages (CSPs): 1.5mm square package rework) | (CSPs: 1mm square package rework) | (CSPs: 1mm square package rework) | ||
(Quad-flat, no lead (QFN)/ BTC/ dual-flat, no lead (DFN): 1mm square package with some bottom terminations (14 terminations)). | (QFN/ BTC/ DFN: 1mm square package with increased number of bottom terminations (12)). | (QFN/ BTC/ DFN: 1mm square package with increased number of bottom terminations (10)). | ||
CURRENT TECHNOLOGY STATUS | Solutions deployed or known | |||
Some rework equipment can handle these small packages. IR rework sources are available so the component does not move during reflow. More difficult to do with convection. | ||||
GAPS |
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CHALLENGES |
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COMPONENT-LEVEL ISSUE #5: Repair- Reballing high I/O Components (greater than 1000 I/O) | ||||
NEED | More cost effective and efficient reballing techniques especially for ultra-micro/ high I/O component sizes. | |||
CURRENT TECHNOLOGY STATUS | Solutions need optimization | |||
Large solder sphere preforms are unwieldy to use (warpage) and to manufacture (one ball missing is a defect). Otherwise stencils and a manual reballing method is required. Additional solder paste printing stencil is required when high temperature solder balls need to be attached. Some companies conduct reballing on contract: this includes specialized equipment such as laser reballing. Reballing capabilities are available in rework equipment. | ||||
GAP | For small volumes of parts, contracting component to reball is not cost-effective. Cost effective and efficient reballing for internal programs. | |||
CHALLENGES |
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COMPONENT-LEVEL ISSUE #6: BGA socket and SMT connector rework (high input/output (I/O) and fine pitch and temperature related issues for connector plastic body) | ||||
NEEDS |
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BGA socket sizes: 100-120mm sockets, 9000 I/O, 2.5-3mm socket height | BGA socket sizes: 130mm sockets, 10000 I/O, <2mm socket height | BGA socket sizes: 150mm sockets, 150000 I/O, <1.5mm socket height | ||
CURRENT TECHNOLOGY STATUS | Solutions need optimization | |||
As parts get bigger, it will become more critical to have higher temperature plastic components which do not soften or warp. This also applies to BGA socket materials. Connectors are being designed too close together so cannot remove a single connector. Coplanarity of the connectors is a concern and coplanarity during thermal cycle. Heat tolerance of connector plastic housing and adjacent connectors. Challenge of removing connector latches. Consider design of single body multi-slot connector in place of current designs. Consider removal of locking latches on connectors and replace them with a lower profile locking method. | ||||
GAPS | Better high temperature resistant connector materials for rework: lack of high temperature plastic connector materials. | |||
CHALLENGES |
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COMPONENT-LEVEL ISSUE #7: Temperature sensitive component rework (MEMS, Sensors, LED and some BGA components- mainly sensor components) | ||||
NEED | Component manufacture development to produce components which can be assembled in SMT reflow oven and are more reworkable (heat tolerant) components/devices by design. | |||
CURRENT TECHNOLOGY STATUS | Solutions need optimization | |||
Thermal keep-away strategies to reduce the issue (Shielding, tape, gels and/or cooling jackets (in combination with ambient or cool air) | ||||
GAP | Lack of components which are tolerant to rework and surface mount technology (SMT) heat environment. | |||
CHALLENGES |
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COMPONENT-LEVEL ISSUE #8: Proliferation of new types of components to rework (large application-specific ICs (ASICs) with incomplete component data available regarding component structure and material which would affect rework (e.g., embedded components in BGA: what solder is used, what is temperature sensitivity of embedded components to better understand how to rework and replace the component successfully) | ||||
NEEDS |
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CURRENT TECHNOLOGY STATUS | Solutions need optimization | |||
Challenging to rework components without component data. Sometimes difficult to rework components even with component data (encapsulated die has different thermal characteristics, etc.). Rework is based on experience and guesswork/ assumptions. | ||||
GAP | Lack of component architecture data and materials used in datasheets to determine best processes for rework. | |||
CHALLENGE | Without this information, rework profiling cannot be conducted with certainty |
Approaches to address Needs, Gaps and Challenges
Table 2 considers approaches to address the above needs and challenges. The evolution of these is projected out over a 10-year timeframe using technology readiness levels (TRLs).
In-table color key | Range of Technology Readiness Levels | Description |
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2 | TRL: 1 to 4 | Levels involving research |
6 | TRL: 5 to 7 | Levels involving development |
9 | TRL: 8 to 9 | Levels involving deployment |
Table 2. Component-level Rework and Repair Potential Solutions
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| EXPECTED TRL LEVEL* | |||
TECHNOLOGY ISSUE | POTENTIAL SOLUTIONS | TODAY (2024) | 3 (2027) | 5 (2029) | 10 |
Component-Level Issue #1 01005 (0402 Metric) and smaller component rework (0201 metric) | Equipment (0402 metric) | 5 | 5 | 5 | 7 |
Manual rework (0402 metric) | 8 | 8 | 8 | 8 | |
Training (0402 metric) | 8 | 8 | 8 | 8 | |
Equipment (0201 metric) | 5 | 5 | 5 | 5 | |
Manual rework (0201 metric) | 8 | 8 | 8 | 8 | |
Training (0201 metric) | 8 | 8 | 8 | 8 | |
Component-Level Issue # 2 PoP rework (multiple substrates) (up to 4 PoP stack up) | High process precision control of rework equipment for 2 stack PoPs | 8 | 8 | 8 | 8 |
Component-Level Issue # 3 BGA rework and Sockets requirements (90mm/ 100mm and above) | Component handling/placement. | 6 | 8 | 8 | 8 |
Standard for large BGA socket (with cover) or BGA component delta T is typically <15C. | 6 | 8 | 8 | 8 | |
Component-Level Issue # 4 Micro-package rework (CSPs: 1.5mm square package rework) (QFN/ BTC/ DFN: 1mm square package with some bottom terminations(14 terminations)) | Component handling and vision alignment. | 8 | 8 | 8 | 8 |
Printing of paste using mini-stencil for very small apertures/ Low Area ratios for QFN/ BTC/ DFN components | 6 | 8 | 8 | 8 | |
Component-Level Issue # 5 Repair- Reballing high I/O Components (greater than 1000 I/O) | Development of more specialized equipment to reball including laser reballing | 6 | 7 | 7 | 8 |
Printing paste on PCB (Stencil) | 6 | 7 | 7 | 7 | |
Printing paste on PCB (Jetting) | 6 | 7 | 7 | 7 | |
Printing paste on component (Stencil) | 7 | 8 | 9 | 9 | |
Dippable solder paste on component | 5 | 6 | 7 | 8 | |
Component-Level Issue # 6 BGA socket and SMT connector rework (high I/O and fine pitch and temperature related issues for connector plastic body) | Higher temperature resistant connector materials | 5 | 6 | 6 | 8 |
Higher temperature resistant socket materials | 5 | 6 | 6 | 8 | |
Component-Level Issue # 7 Temperature sensitive component rework (MEMS, Sensors, LED and some BGA components- mainly sensor components) | Shielding, tape/foils, cooling jackets and gels | 7 | 8 | 9 | 9 |
Heat tolerant components/devices by design | 2 | 2 | 2 | 2 | |
Component-Level Issue #8 Proliferation of new types of component to rework (large ASICs) with incomplete component data available regarding component structure and material which would affect rework (e.g. embedded components in BGA: what solder is used, what is temperature sensitivity of embedded components to better understand how to rework and replace the component successfully) | More transparency by component supplier on component data with respect to rework temperature and time limitations. | 5 | 6 | 6 | 7 |
Increased knowledge by component manufacturers with respect to rework tools, and process knowledge covering rework specifications. | 5 | 6 | 6 | 7 | |
Consideration and use of alternatives such as low temperature solders/ epoxies for rework. | 7 | 7 | 8 | 8 | |
More complete and readily available component data regarding internal component structure and material which would affect rework (e.g. embedded components in BGA) | 7 | 8 | 8 | 8 | |
Readily available component data related to warpage during reflow/ rework | 6 | 6 | 7 | 8 |
References
Jason Keeling. Ed. Jasbir Bath. Conformal Coatings. https://onlinelibrary.wiley.com/doi/abs/10.1002/9781119482093.ch13
Board Assembly Acronyms
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